Archived News – 2005

Archived News – 2005

October 17, 2005 – Xradia Announces 3D X-ray Microscope

CONCORD, California – (Business Wire) – October 17, 2005: X-ray microscopy company Xradia, Inc. announced today the launch of its new MicroXCT X-ray microscope, featuring full 3D tomography image reconstruction. The MicroXCT is designed for use in semiconductor packaging failure analysis and defect review, while offering powerful imaging capabilities for applications ranging from specialty materials to bio-tech and life sciences.
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September 29, 2005 – Xradia Announces $1.4M NIH Grant for Nano-scale X-ray Microscope

Concord, CA – September 29, 2005: Xradia, Inc., a developer and manufacturer of ultra-high-resolution X-ray imaging systems for 3D tomography and nanotechnology applications, today announced receipt of a $1.4 million grant from the National Institutes of Health (NIH) for the development of an ultra-high resolution X-ray microscope for the three-dimensional imaging of complex biological systems.
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July 11, 2005 – Xradia Announces X-ray Fluorescence Imaging Tool

CONCORD, California – (Business Wire) – July 11, 2005: X-ray microscopy company Xradia, Inc. announced today the release of a new element-specific X-ray imaging tool for semiconductor metrology, Scanning Electron Microscopes (SEM) and Electron Probe Micro Analyzers.
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