Archived News – 2010

Archived News – 2010

December 1, 2010 – Xradia Exhibits X-ray Vision for Semiconductor Failure Analysis at Semicon Japan

Tokyo, Japan, December 1, 2010: Xradia Inc., the leading provider of high-resolution non destructive 3D X-ray imaging systems, announced today that its solutions for semiconductor failure analysis will be presented by its representative, Canon Marketing Group Japan, in CMJ’s booth 3C-701 during Semicon Japan. Representatives will discuss imaging solutions from 30 µm to 50 nm with its MicroXCT and UltraXRM computed tomography technology for a range of failure analysis issues.
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September 14, 2010 – Xradia Selects Canon Marketing Japan to Distribute Its 3D X-ray Microscopy Systems

CONCORD, CA–(Marketwire – September 14, 2010) Xradia, Inc., the leader in commercial high resolution 3D X-ray microscopy systems for the laboratory and synchrotrons, announced today a partnership agreement with Canon Marketing Japan, Inc., an affiliate of Canon Inc.
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August 30, 2010 – Growing R&D Company Xradia Inc. Moving to Pleasanton
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August 16, 2010 – Xradia Introduces UltraXRM Microscope: Ground-breaking 3D X-Ray Imaging for Laboratories

CONCORD, Calif. – August 16, 2010: A new lab-based computed tomography (CT) system, capable of delivering synchrotron-like 3D imaging at 50 nanometer resolution within a laboratory setting, was announced today by Xradia, Inc. The UltraXRM-L200 is the newest addition to the ultra-high resolution UltraXRM™ nanoscale family of X-ray microscopes. The microscope uses state of the art X-ray optics originally developed for synchrotron research facilities to enable best-in-class resolution and efficiency in lab settings.
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