Materials Science

Materials Science Solutions

Building upon advanced X-ray optics developed for synchrotron sources, ZEISS X-ray microscopy (XRM) has emerged as a critical imaging technique in research laboratories. Xradia Versa and Ultra lab-based solutions advance resolution and contrast to levels comparable to synchrotron micro beamlines, extending non-destructive 3D imaging to a much broader user base.

Xradia 3D XRM laboratory systems complement existing electron and optical techniques, adding a non-destructive stage to the traditional workflow that helps rapidly identify regions of interest for higher-resolution imaging using destructive techniques. Applications for ZEISS XRM in materials science include:

4D studies (3D plus time)

  • Observing microstructural evolutionin the same sample location over time
  • Viewing effects of successive treatments on the same sample

In situ studies

  • Imaging materials in their natural environment>
  • Analyzing 3D microstructural evolution of a sample under varying conditions, such as with external loads, temperature or environmental stresses applied

Imaging defects and pores

  • Quantify porous networks (porosity, connectivity, tortuosity)
  • 3D crack propagation
  • Dilatation of electrode materials

Improving imaging workflow

  • Rapidly identifying buried regions of interest for further imaging with destructive FIB/SEM, TEM and Atom Probe sample preparation and analysis

High contrast imaging for low Z or unstained soft materials

  • Leveraging compositional contrast, phase contrast (propagation and Zernike) and absorption contrast imaging to detect low Z, soft, similar density phases and unstained biological materials

Advancing the Process

High resolution techniques such as TEM, FIB/SEM and atom probe tomography provide chemical and imaging information down to the atomic level but destroy samples in the process. Xradia laboratory-based Versa and Ultra solutions fill the 3D imaging gap left by these techniques, enabling essential microstructural quantification and context imaging prior to the final destructive characterization step.

By also enabling flexible working distances, Xradia Versa promote use of advanced methods such as in situand used to quantify structure-function relationships in diverse materials.