Pleasanton, CA – July 28, 2014 – ZEISS announces a new option for Xradia Versa 3D X-ray microscopes for submicron imaging: the XRM Autoloader for automated sample handling. Autoloader helps gain critical efficiency and maximizes utilization of Xradia Versa systems by reducing the user-instrument interaction for sample batches that can be run throughout the workday, overnight, and even over typically under-used weekend time.
Autoloader is flexible for handling diverse sample types in the same queue, offers workflow solutions for volume jobs, and also facilitates precise and repeatable sample measurements. It is especially valuable in industries where increased utilization can provide a positive impact on profitability. Users are able to set up queues of imaging jobs to maximize XRM usage, thus increasing effective throughput. As an additional convenience, users may receive automatic notification, including via their mobile devices if desired, of each successively completed scan.
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PLEASANTON, CA—January 24, 2014. – Carl Zeiss X-ray Microscopy, formerly Xradia, Inc., announced today that Kawasaki, Japan-based Toshiba Nanoanalysis Corporation has selected the recently-introduced ZEISS Xradia 520 Versa 3D X-ray microscope (XRM) to expand the capabilities of its busy analysis lab. Toshiba Nanoanalysis offers imaging services for complex analytical demands in semiconductor, biosciences and materials science research for industry and academia.
According to Mr. Koichiro Tomoda, General Manager of the Evaluation and Analysis Technology Center, the major appeal for the Toshiba Nanoanalysis lab services team is the instrument’s unprecedented flexibility. “We believe the Xradia 520 Versa will enable us to expand the capabilities of our lab to study even more diverse materials. We are very excited to begin using this 3D X-ray microscope to expand the number of applications we are able to offer our customers.”
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