For scientific and industrial research
The progress of scientific research and technology development greatly depends upon effective imaging solutions for characterizing the properties and behaviors of materials. Revealing details of microstructure, ideally in 3D, is a critical part of this understanding, whether the goal is to develop and confirm models that describe material properties and behaviors or simply to visualize structural details. ZEISS offers 3D X-ray microscopes (XRM): advanced imaging solutions that have removed major hurdles for three-dimensional imaging by achieving high contrast and submicron resolution imaging even for relatively large samples. These groundbreaking advances in non-destructive, three-dimensional (3D) imaging empower a broad range of technical disciplines.
The Xradia Versa family of submicron XRM uses patented X-ray detectors within a microscope turret of objectives for easy zooming <700nm spatial resolution with minimum achievable voxels of 70nm. The Xradia Ultra family of nanoscale X-ray microscopes is the only commercially available X-ray microscope that utilizes synchrotron quality X-ray optics and provides true spatial resolution down to <50nm and minimum achievable voxels of 16nm.
ZEISS Xradia 520 Versa
Extending the Limits of Exploration
ZEISS Xradia 510 Versa
Flexible Working Distance at the Highest Resolution
ZEISS Xradia 410 Versa
Bridging the Gap in Lab-based Microscopy
ZEISS Xradia 810 Ultra
Nanoscale X-ray Imaging:
Extending the reach and value of 3D microscopy
ZEISS Xradia 800 Ultra
Synchrotron-like Performance in the Lab
Nanoscale X-ray Microscopy for Synchrotrons