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nanoXCT-S100
Courtesy of
SLAC National Accelerator Laboratory

nanoXCT-S100

Energy-tunable, Ultra-high Resolution 3D X-ray Microscopy For Synchrotron Facilities

The nanoXCT-S100 harnesses the powerful X-ray beams produced by synchrotron radiation facilities for ultra-high resolution 3D X-ray microscopy. Combined with the superior X-ray imaging technology developed for the laboratory-source nanoXCT-100, the nanoXCT-S100 is capable of producing 3D images with sub-40 nm resolution. The tunability of X-ray photon energies at synchrotron sources enables spectroscopic imaging for elemental contrast and chemical state mapping. Integrated Zernike phase contrast imaging enhances the visibility of internal edges and interfaces when absorption contrast is low. Xradia's proven technology delivers a sophisticated turnkey solution with the nanoXCT-S100, making it a must for any synchrotron facility developing a high-resolution X-ray imaging capability.

Applications:

  • Life Science Studies
  • Semiconductor Package FA
  • Advanced Material Analysis
  • Oil & Gas Drilling Feasibility Models

nanoXCT-S100–Energy-tunable, Ultra-high Resolution 3D X-ray Microscopy for Synchrotron Facilities

The revolutionary nanoXCT-S100 marries Xradia's proprietary X-ray optics with the advanced X-ray source of a synchrotron radiation facility into an ultra-high resolution non-destructive 3D imaging solution. With currently available resolution below 40 nm, the nanoXCT-S100 is providing insight into microscopic structures and processes previously not accessible with conventional X-ray imaging technology. The intrinsic capability of synchrotron sources to easily tune the X-ray energy enables the nanoXCT-S100 to distinguish different elements in the 3D volume and collect spatially resolved absorption spectroscopy data. Incorporating multiple switchable configurations of X-ray optics, the nanoXCT-S100 enables access to a wide range of accessible X-ray energies from typically 4 keV up to 12 keV. The advanced reflective condenser technology developed by Xradia combined with bright second and third generation synchrotron X-ray sources enables fast, precise 3D X-ray imaging. Xradia's proprietary X-POSE technology implements a practical, easy-to-use approach for Zernike phase contrast imaging for visualization of samples with low X-ray absorption.

Benefits

  • Non-destructive 3D X-ray imaging
  • Ultra-high resolution to sub-40 nm
  • Elemental contrast and X-ray absorption spectroscopy at full spatial resolution
  • Short exposure times with second and third generation synchrotrons
  • X-POSE technology employing Zernike phase contrast imaging

Applications

Life Science Research

Organelles, such as lysosomes, are clearly visible in the sub-cellular structure of stained cells, and features such as canaliculi between osteocytic lacunae are clearly visible within slices of bone.

Semiconductor Package Failure Analysis

The nanoXCT-S100 offers visualization of semiconductor samples and wafer-level packaging, such as integrated circuits and through-silicon vias, for defect investigation and failure analysis without the need for physical cross-sectioning.

Advanced Material Development

Variable configurations of the X-ray optics enable novel measurements such as X-ray absorption spectroscopy (XANES) for identification and segmentation of different materials within a sample.

Oil & Gas Drilling Feasibility Studies

The nanoXCT-S100 offers a unique insight into oil & gas drilling feasibility studies through the visualization of rocks, providing input data for pore and flow modeling on the nano scale.

Next Steps