UltraSPX-S
Ultra-high Resolution Analytical Scanning X-ray Microprobe for Synchrotron Facilities
Xradia's UltraSPX-S series of scanning X-ray microprobes leverages highly coherent X-ray beams from undulator-based synchrotron beamlines in combination with proprietary optics to produce some of the finest X-ray probes available worldwide. Laser-interferometer technology and precision piezo stages provide sub-5 nm positioning of beam and sample with excellent long-term stability, to produce ultra-high resolution maps of specimen properties. In the soft X-ray range, typically transmitted intensity is detected as a function of position and X-ray energy, to produce X-ray Absorption Near-Edge Structure (XANES) image stacks revealing chemical composition and the binding state of elements. At higher X-ray energies, elemental information can be acquired by detecting fluorescence photons with sensitivities as low as parts-per-billion. Additional detection modalities such as a configured transmission detector for phase contrast imaging or a diffraction detector for crystallographic phase mapping can be added easily to the system to provide additional structural information. Xradia's open system architecture allows flexible configuration for a variety of customer requirements.
Benefits
- Structural, chemical, elemental and crystallographic information on the nanoscale
- Ultra-high optical resolution to 30 nm
- Fluorescence, absorption, XANES and / or phase contrast
- Sub-5 nm long-term positional stability
- Open system architecture offers flexible configuration depending on application requirements
- Cryogenic sample handling to minimize the effects of radiation damage for organic specimens (high energy version)
Applications
Life Science Research
Ability to map trace elements in single cells or tissue samples with part-per-billion sensitivity providing insight into the distribution, local concentration, uptake and toxicity of trace elements and nanoparticles.
Semiconductor Characterization
The UltraSPX-S offers a unique solution to directly probe properties such as strain or doping concentration that are used in modern ICs on the nano-scale without destroying the IC structure.
Advanced Material Analysis
Xradia's UltraSPX-S X-ray analytical scanning microscope provides characterization of the properties of nano-materials to enable new technology developments in applications such as alternative energy, fuel cells, micromechanics, and industrial processes.
Geological and Environmental Sciences
The UltraSPX-S enables measuring of geoscience samples in their natural environment and enables predictions of system behavior over long time spans, critical for nuclear waste storage and contamination cleanup.