Solutions Overview

Solutions Overview

What is a ZEISS Xradia X-ray Microscope?
And why is it such a powerful instrument for your research?

Our advanced 3D X-ray microscopes (XRM) enable the discovery process that helps you advance innovation in your area of research or engineering. XRM can be used for many applications in a number of fields, including materials science, life sciences, natural resources and the electronics industry. The ability to visualize submicron features of your sample as small as 50 nm in size in native full volume 3D form, non-destructively, and to perform automated correlation of 2D images and complex data will enhance and possibly transform your critical imaging and data analysis tasks.

While the application of ZEISS products is powerful in many different areas of research and engineering, we have optimized our solutions in selected categories, providing a complete multi-length scale alternative for imaging samples from the meso- to the micro- and nano-length scale. 

Using computed tomography (CT) to create 3D datasets, our proprietary X-ray detector technology and unique contrast modes provide you with a unique ability to image soft tissue with excellent contrast even in combination with calcified tissue and bone structures. Materials scientists are able to visualize subsurface interfaces at nanometer level as well as material defects such as cracks and voids. Semiconductor process development and failure analysis engineers use our Xradia Versa family of products to verify micron size defects without the need for any physical de-layering or cross sectioning. In oil and gas research, XRM allow non-destructive 3D imaging and data collection on rock samples at multiple length scales to understand porosity, permeability, tortuosity.

ZEISS Xradia 3D X-ray microscopes offer the industry’s highest resolution and best contrast while maintaining resolution even at large working distances, enabling unparalleled imaging of your larger samples. Achieved by a combination of unique optics and a dual magnification system – reducing the limitations created by a dependence on geometric magnification used by conventional micro-computed tomography systems – ZEISS Xradia 3D X-ray microscopes stand alone. In your own lab, you can achieve non-destructive materials characterization in 3D, 4D and in situ studies. Scout-and-Zoom to an interior region of interest viewable only with X-ray vision, then use multi-length scale correlative workflows to maximize the data acquired with the full suite of ZEISS instruments—LM to XRM to EM.

Contact Us

The Link to Correlative

> Learn More

Don’t see your material

Tell us what your challenge is.
New solutions development is
dynamic at Carl Zeiss Microscopy.

> Complete this short form