From research to industry, ZEISS Xradia 3D X-ray microscopes (XRM) are uniquely architected to facilitate quantitative understanding of microstructure under both ambient and in situ environmental conditions without destroying the sample. This enables imaging and tomography of microstructures as well as observation of micro- and nano-structural evolution under a variety of conditions.
Industry-leading resolution, from synchrotron to laboratory
Our synchrotron heritage enabled us to develop superior lab-based XRM. The ZEISS Xradia Versa family, at true submicron spatial resolution of 700 nm and minimum achievable voxel* size of 70 nm, and the ZEISS Xradia Ultra family at 50 nm resolution and 16 nm voxel* are a new caliber of 3D X-ray microscope. These systems offer a distinct set of unique technological advantages beyond the limits of conventional micro- and nano-CT.
* Voxel (also referred to as “nominal resolution” or “detail detectability”) is a geometric term that contributes to but does not equal resolution, and is provided here only for comparison. ZEISS Xradia XRM specify on spatial resolution, the most meaningful measurement of an instrument’s performance.