ZEISS Xradia 510 Versa

ZEISS Xradia 510 Versa
Breakthrough flexibility for 3D submicron imaging

Introduction


Versatility even at large working distances – mm to inches from source

Achieve new levels of discovery with ZEISS Xradia 510 Versa 3D X-ray microscopes (XRM), the industry’s premier in situ / 4D solution. Our unique RaaD (resolution at a distance) capability breaks the one micron resolution barrier for samples from mm to cm. Use the instrument’s powerful combination of world-leading resolution and contrast with flexible working distances to extend the power of non-destructive imaging in your lab.

Ask your ZEISS contact about ZEISS Xradia 510 Versa now!


Highlights


True Submicron Spatial Resolution at Millimeters to Inches from Source

Non-destructive X-ray imaging preserves and extends the use of your valuable samples. Maximize the power of X-ray microscopy (XRM) with Xradia 510 Versa using flexible 3D imaging for a wide range of samples and research environments. Extending synchrotron-caliber performance to premier labs worldwide, Xradia 510 Versa achieves 0.7 μm true spatial resolution with minimum achievable voxel size below 70 nm. Experience increased versatility for soft or low-Z materials with advanced absorption contrast along with innovative phase contrast to overcome the limitations of traditional computed tomography approaches.

Achieve performance beyond micro-CT and extend scientific research past the limits of flat-panel systems with ZEISS Xradia Versa solutions. Where traditional tomography relies on a single stage of geometric magnification, Xradia Versa instruments feature a unique two-stage process based on synchrotron-caliber optics with a detection system optimized for resolution and contrast.

Choose the industry’s premier 4D / in situ solution to uniquely characterize the microstructure of materials in their native environments as well as to study the evolution of properties over time (4D). Use its flexible multi-length scale capabilities to image the same sample across a wide range of magnifications. Breakthrough Xradia Resolution at a Distance (RaaD) enables unprecedented lab-based exploration for a diverse array of applications, sample types and under varying conditions in high-precision in situ rigs. The Xradia Versa In Situ Kit allows you to optimize set-up, makes operation easy and provides a faster time to results.

The optional Versa In Situ Kit organizes the facilities that support in situ rigs (such as wiring and plumbing) to enable maximum imaging performance and ease of use.

Additionally, the Scout-and-Scan control system enables an efficient workflow environment with recipe-based set-up makes Xradia 510 Versa easy for users with a wide variety of experience levels.

Ask your ZEISS contact about ZEISS Xradia 510 Versa now!

Applications


Materials Research
Expand your materials research capabilities, whether visualizing cracks in soft composite materials or measuring porosity in steel, all with a single system. Perform in situ studies by imaging under varying conditions such as tensile, compression, gas, oxidation, wetting and temperature variations. Image materials that are incompatible with vacuum and charged particle beams.

Xradia 510 Versa offers the ability to view into deeply buried microstructures that may be unobservable with 2D surface imaging such as optical microscopy, SEM, and AFM. You have the ability to maintain resolution at a distance for in situ imaging experiments, allowing you to study a wide variety of sample sizes and shapes using various in situ apparatus. Understand the impact of these varying conditions over time with the non-destructive nature of X-ray.

Natural Resources
Characterize and quantify pore structure and connectivity, understand porosity and permeability, analyze mineral liberation efforts, and study carbon sequestration effectiveness. Experience the most accurate 3D, submicron characterization of rock pore structures for digital rock simulations and perform in situ multiphase fluid flow studies.

Life Sciences
Leverage the high resolution and high contrast for exploring unstained and stained hard and soft tissues. Quantify osteocyte properties for bone morphology, map neural networks, study vasculature, and understand development of bio structures.

Electronics
Optimize your processes and analyze failures. Use non-destructive submicron imaging of intact packages for defect localization and characterization. Measure buried features in three dimensions. Xradia Versa offer the industry’s highest resolution, non-destructive solution for 3D submicron imaging that complements or replaces physical cross sectioning methods.

To learn more about applications for ZEISS Xradia 510 Versa, visit http://www.zeiss.com/microscopysolutions/xrm.html

Software


Visualization and Analysis Software
ZEISS recommends Visual SI Advanced from Object Research Systems (ORS)
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray microscopy, FIB-SEM and SEM.
Using advanced visualization techniques and state-of-the-art volume rendering, Visual SI Advanced enables high definition exploration into the details and properties of 3D datasets.

Benefits



Xradia Versa architecture uses a two-stage magnification technique to enable you to uniquely achieve resolution at a distance (RaaD). In the first stage, enlarge sample images through geometric magnification as with conventional micro-CT. In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. Reducing dependence upon geometric magnification enables Xradia Versa instruments to maintain submicron resolution at large working distances. This enables you to study the widest range of sample sizes effectively, including within in situ chambers. Additionally, a variety of optional features extend the benefits achieved by the system’s core architecture.

  • Preserve and extend the use of valuable samples with non-destructive 3D imaging
  • Achieve the highest resolution at the largest working distance from the source, a prerequisite for in situ and large sample imaging, with the unique Versa microscope design
  • Multi-length scale imaging of the same sample across a wide range of magnifications, down to <0.7 µm true spatial resolution and below 70 nm voxel size
  • Industry-leading 4D and in situ capabilities, supporting a wide variety of in situ rigs for submicron imaging of practical sized samples (mm to inches) with weight capability up to 25kg and sample size up to 300mm
  • Unique architecture with dual stage magnification enables easy navigation through multiple magnification detector system, continuous operation through automated multiple point tomography and repetitive scanning, and high speed reconstruction
  • Advanced absorption and phase contrast for low Z materials and soft tissue
  • Scout-and-Scan™ control system for easy-to-use workflow set-up ideal in multi-user environments
  • Minimal need for sample preparation
  • Optional Versa In Situ Kit organizes the facilities that support environmental chambers (such as wiring and plumbing) to enable maximum imaging performance and ease set-up
  • Autoloader option enables you to program and run up to 14 samples at a time to maximize productivity, automate workflows for high volume scanning

Ask your ZEISS contact about ZEISS Xradia 510 Versa now!


Downloads




Introduction


Versatility even at large working distances – mm to inches from source

Achieve new levels of discovery with ZEISS Xradia 510 Versa 3D X-ray microscopes (XRM), the industry’s premier in situ / 4D solution. Our unique RaaD (resolution at a distance) capability breaks the one micron resolution barrier for samples from mm to cm. Use the instrument’s powerful combination of world-leading resolution and contrast with flexible working distances to extend the power of non-destructive imaging in your lab.

Ask your ZEISS contact about ZEISS Xradia 510 Versa now!


Highlights


True Submicron Spatial Resolution at Millimeters to Inches from Source

Non-destructive X-ray imaging preserves and extends the use of your valuable samples. Maximize the power of X-ray microscopy (XRM) with Xradia 510 Versa using flexible 3D imaging for a wide range of samples and research environments. Extending synchrotron-caliber performance to premier labs worldwide, Xradia 510 Versa achieves 0.7 μm true spatial resolution with minimum achievable voxel size below 70 nm. Experience increased versatility for soft or low-Z materials with advanced absorption contrast along with innovative phase contrast to overcome the limitations of traditional computed tomography approaches.

Achieve performance beyond micro-CT and extend scientific research past the limits of flat-panel systems with ZEISS Xradia Versa solutions. Where traditional tomography relies on a single stage of geometric magnification, Xradia Versa instruments feature a unique two-stage process based on synchrotron-caliber optics with a detection system optimized for resolution and contrast.

Choose the industry’s premier 4D / in situ solution to uniquely characterize the microstructure of materials in their native environments as well as to study the evolution of properties over time (4D). Use its flexible multi-length scale capabilities to image the same sample across a wide range of magnifications. Breakthrough Xradia Resolution at a Distance (RaaD) enables unprecedented lab-based exploration for a diverse array of applications, sample types and under varying conditions in high-precision in situ rigs. The Xradia Versa In Situ Kit allows you to optimize set-up, makes operation easy and provides a faster time to results.

The optional Versa In Situ Kit organizes the facilities that support in situ rigs (such as wiring and plumbing) to enable maximum imaging performance and ease of use.

Additionally, the Scout-and-Scan control system enables an efficient workflow environment with recipe-based set-up makes Xradia 510 Versa easy for users with a wide variety of experience levels.

Ask your ZEISS contact about ZEISS Xradia 510 Versa now!


Applications


Materials Research
Expand your materials research capabilities, whether visualizing cracks in soft composite materials or measuring porosity in steel, all with a single system. Perform in situ studies by imaging under varying conditions such as tensile, compression, gas, oxidation, wetting and temperature variations. Image materials that are incompatible with vacuum and charged particle beams.

Xradia 510 Versa offers the ability to view into deeply buried microstructures that may be unobservable with 2D surface imaging such as optical microscopy, SEM, and AFM. You have the ability to maintain resolution at a distance for in situ imaging experiments, allowing you to study a wide variety of sample sizes and shapes using various in situ apparatus. Understand the impact of these varying conditions over time with the non-destructive nature of X-ray.

Natural Resources
Characterize and quantify pore structure and connectivity, understand porosity and permeability, analyze mineral liberation efforts, and study carbon sequestration effectiveness. Experience the most accurate 3D, submicron characterization of rock pore structures for digital rock simulations and perform in situ multiphase fluid flow studies.

Life Sciences
Leverage the high resolution and high contrast for exploring unstained and stained hard and soft tissues. Quantify osteocyte properties for bone morphology, map neural networks, study vasculature, and understand development of bio structures.

Electronics
Optimize your processes and analyze failures. Use non-destructive submicron imaging of intact packages for defect localization and characterization. Measure buried features in three dimensions. Xradia Versa offer the industry’s highest resolution, non-destructive solution for 3D submicron imaging that complements or replaces physical cross sectioning methods.

To learn more about applications for ZEISS Xradia 510 Versa, click here

Software


Visualization and Analysis Software
ZEISS recommends Visual SI Advanced from Object Research Systems (ORS)
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray microscopy, FIB-SEM and SEM.
Using advanced visualization techniques and state-of-the-art volume rendering, Visual SI Advanced enables high definition exploration into the details and properties of 3D datasets.

Benefits



Xradia Versa architecture uses a two-stage magnification technique to enable you to uniquely achieve resolution at a distance (RaaD). In the first stage, enlarge sample images through geometric magnification as with conventional micro-CT. In the second stage, a scintillator converts X-rays to visible light, which is then optically magnified. Reducing dependence upon geometric magnification enables Xradia Versa instruments to maintain submicron resolution at large working distances. This enables you to study the widest range of sample sizes effectively, including within in situ chambers. Additionally, a variety of optional features extend the benefits achieved by the system’s core architecture.

  • Preserve and extend the use of valuable samples with non-destructive 3D imaging
  • Achieve the highest resolution at the largest working distance from the source, a prerequisite for in situ and large sample imaging, with the unique Versa microscope design
  • Multi-length scale imaging of the same sample across a wide range of magnifications, down to <0.7 µm true spatial resolution and below 70 nm voxel size
  • Industry-leading 4D and in situ capabilities, supporting a wide variety of in situ rigs for submicron imaging of practical sized samples (mm to inches) with weight capability up to 25kg and sample size up to 300mm
  • Unique architecture with dual stage magnification enables easy navigation through multiple magnification detector system, continuous operation through automated multiple point tomography and repetitive scanning, and high speed reconstruction
  • Advanced absorption and phase contrast for low Z materials and soft tissue
  • Scout-and-Scan™ control system for easy-to-use workflow set-up ideal in multi-user environments
  • Minimal need for sample preparation
  • Optional Versa In Situ Kit organizes the facilities that support environmental chambers (such as wiring and plumbing) to enable maximum imaging performance and ease set-up
  • Autoloader option enables you to program and run up to 14 samples at a time to maximize productivity, automate workflows for high volume scanning

Ask your ZEISS contact about ZEISS Xradia 510 Versa now!


Downloads



Cuttlefish (movie)

Sintered Steel (movie)

Shale with Pore Connectivity
Pore Connectivity

Package-on-Package Assembly
Pore Connectivity

Visualization & Analysis Software
| Visual SI Advanced