ZEISS Xradia 800 Ultra

Visualization & Analysis Software
| Visual SI Advanced
ZEISS Xradia 800 Ultra

Ultra-high Resolution, Non-destructive 3D Imaging


Introduction


Synchrotron-like Performance in the Lab

With the ZEISS Xradia 800 Ultra X-ray microscope, achieve spatial resolution down to 50 nm, the highest among lab-based X-ray imaging systems. With non-destructive 3D imaging playing a vital role in today’s breakthrough research, you will experience unparalleled performance in an ultra-high resolution lab-based system. The innovative Xradia Ultra architecture features absorption and phase contrast imaging modes and X-ray energy of 8 keV, using unique optics adapted from the synchrotron. With Xradia 800 Ultra, expect to accomplish unrivaled in situ and 4D capabilities for studying material evolution over time and extend the limits of X-ray imaging used in materials science, life sciences, natural resources, and diverse industrial applications.

Ask your ZEISS contact about ZEISS Xradia 800 Ultra now!


Highlights


With resolution as fine as 50 nm, Xradia 800 Ultra provides you with insight into microscopic structures and processes previously not accessible with conventional lab-based X-ray technology. Operating with 8 keV X-rays provides excellent penetration and contrast for a wide range of materials, enabling you to observe structures and materials in their natural state.

ZEISS integrated phase contrast technology employing the Zernike method allows enhanced visibility of grain boundaries and material interfaces when absorption contrast is low, providing you with visibility of ultra- and nano-structures without staining.

ZEISS Xradia 800 Ultra delivers reliable internal 3D information otherwise only accessible with destructive methods like cross-sectioning. The large working distance and atmospheric sample environment allow you to perform in situ studies with ease.

Ask your ZEISS contact about ZEISS Xradia 800 Ultra now!


Applications


ZEISS Ultra Load Stage

In situ Nanomechanical Test Stage for 3D X-ray Imaging

Understand nanostructural changes in 3D under load
ZEISS Ultra Load Stage uniquely enables in situ nanomechanical testing—compression, tension, indentation—with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales.
Highlights
Add in situ nanomechanical testing testing capabilities to your Xradia Ultra nanoscale 3D X-ray microscope (XRM)
Acquire 3D tomograms of your sample under load with resolution down to 50 nm
Perform a variety of nanomechanical tests such as compression, tension, and indentation
Study a wide range of materials including metals, ceramics, composites, polymers and biomaterials
Complement your mechanical test results from electron microscopy, microCT and stand-alone test set-ups to understand behavior across multiple length scales: from the atomic level and the nanoscale to the micro and macro scale.
Available in two models with different force measurement:
LS108: 0.8 N maximum force
LS190: 9 N maximum force
Compatible with:
ZEISS Xradia 800 Ultra
ZEISS Xradia 810 Ultra
Xradia UltraXRM-L200
Xradia nanoXCT-200

How it works:
ZEISS Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement. The load stage operates on samples of sizes typical of the nanoscale X-ray microscope, on the order of a 10-100 micron diameter cross section.

MODES
Compression
Observe deformation and failure of materials under uniaxial compressive load. Study elastic and plastic deformation and determine if the effects are uniform, anisotropic or localized relative to nanostructural features such as voids, struts or interfaces.
Tension
Observe deformation and failure of materials under uniaxial tensile load. Understand critical properties like elastic modulus and tensile yield strength and how they relate to the specific nanostructural features of the specimen.
Indentation
Study isolated deformation and failure events surrounding the indentation site. Understand crack generation and propagation, or delamination of coatings and layered structures.
Key applications
In situ nanomechanical testing is relevant for a broad range of
applications covering both engineered and natural materials.
Examples include:
• High strength alloys
• Biomaterials / biomechanics
• Coatings
• Building materials
• Fibers / composites
• Foams
Downloads
Product Info: ZEISS Ultra Load Stage | In situ Nanomechanical Test Stage for 3D X-ray Imaging
Tech Note: In Situ Observation of Mechanical Testing at the Nanoscale
Applications Note: In situ 3-D Imaging of Crack Growth in Dentin at the Nanoscale
Application Note: In situ Uniaxial Compression of Single Crystals of HMX explosive during 3D XRM Imaging

Software


Visualization and Analysis Software
ZEISS recommends Visual SI Advanced from Object Research Systems (ORS)
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray microscopy, FIB-SEM and SEM.
Using advanced visualization techniques and state-of-the-art volume rendering, Visual SI Advanced enables high definition exploration into the details and properties of 3D datasets.

Benefits


  • Non-destructive 3D X-ray imaging allows repeated imaging of the same sample allowing direct observation of microstructural evolution
  • High resolution down to 50 nm is maintained for imaging of samples within in situ devices
  • Automated image alignment for tomographic reconstruction
  • Switchable field-of-view ranging from 15 to 60 µm
  • Absorption and Zernike phase contrast imaging modes
  • Develop, prepare and test your planned synchrotron experiments in your laboratory to make limited availability of synchrotron beam time more efficient

Ask your ZEISS contact about ZEISS Xradia 800 Ultra now!


Downloads




Introduction


Synchrotron-like Performance in the Lab

With the ZEISS Xradia 800 Ultra X-ray microscope, achieve spatial resolution down to 50 nm, the highest among lab-based X-ray imaging systems. With non-destructive 3D imaging playing a vital role in today’s breakthrough research, you will experience unparalleled performance in an ultra-high resolution lab-based system. The innovative Xradia Ultra architecture features absorption and phase contrast imaging modes and X-ray energy of 8 keV, using unique optics adapted from the synchrotron. With Xradia 800 Ultra, expect to accomplish unrivaled in situ and 4D capabilities for studying material evolution over time and extend the limits of X-ray imaging used in materials science, life sciences, natural resources, and diverse industrial applications.

Ask your ZEISS contact about ZEISS Xradia 800 Ultra now!


Highlights


With resolution as fine as 50 nm, Xradia 800 Ultra provides you with insight into microscopic structures and processes previously not accessible with conventional lab-based X-ray technology. Operating with 8 keV X-rays provides excellent penetration and contrast for a wide range of materials, enabling you to observe structures and materials in their natural state.

ZEISS integrated phase contrast technology employing the Zernike method allows enhanced visibility of grain boundaries and material interfaces when absorption contrast is low, providing you with visibility of ultra- and nano-structures without staining.

ZEISS Xradia 800 Ultra delivers reliable internal 3D information otherwise only accessible with destructive methods like cross-sectioning. The large working distance and atmospheric sample environment allow you to perform in situ studies with ease.

Ask your ZEISS contact about ZEISS Xradia 800 Ultra now!


Applications


Materials Research
For advanced materials development: study and predict material properties and evolution. Characterize 3D structures of composite materials, such as fuel cells, polymers and composites. Measure and identify porosity, cracks, phase distribution etc. Material of different densities may be segmented through the use of absorption-contrast imaging.

Natural Resources
Oil & gas drilling feasibility studies: perform virtual core analysis to reduce time to results. Nanoscale pore structure measurements for geological samples can now be conducted in a few hours compared to traditional core analysis. Perform flow modeling on the nanoscale to complement submicron imaging with the Versa microscope.

Life Sciences
Xradia 800 Ultra offers the ability to visualize the internal structure of biological specimens, such as bone and soft tissue, with resolution down to 50 nm. It offers superior contrast, nanoscale 3D X-ray imaging for a variety of materials such as polymers for drug delivery, tissue samples, and scaffolds for tissue engineering.

Electronics
Xradia 800 Ultra offers visualization of semiconductor samples for electronics packaging research and development.

To learn more about applications for ZEISS Xradia 800 Ultra, click here.

Software


Visualization and Analysis Software
ZEISS recommends Visual SI Advanced from Object Research Systems (ORS)
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray microscopy, FIB-SEM and SEM.
Using advanced visualization techniques and state-of-the-art volume rendering, Visual SI Advanced enables high definition exploration into the details and properties of 3D datasets.

Benefits


  • Non-destructive 3D X-ray imaging allows repeated imaging of the same sample allowing direct observation of microstructural evolution
  • High resolution down to 50 nm is maintained for imaging of samples within in situ devices
  • Automated image alignment for tomographic reconstruction
  • Switchable field-of-view ranging from 15 to 60 µm
  • Absorption and Zernike phase contrast imaging modes
  • Develop, prepare and test your planned synchrotron experiments in your laboratory to make limited availability of synchrotron beam time more efficient

Ask your ZEISS contact about ZEISS Xradia 800 Ultra now!


Downloads




Accessories


ZEISS Ultra Load Stage

In situ Nanomechanical Test Stage for 3D X-ray Imaging

Understand nanostructural changes in 3D under load
The Optional ZEISS Ultra Load Stage uniquely enables In situ nanomechanical testing—compression, tension, indentation—with non-destructive 3D imaging. Study the evolution of interior structures in 3D, under load, down to 50 nm resolution. Understand how deformation events and failure relate to local nanoscale features. Complement existing mechanical testing methods to gain insight into behavior across multiple length scales.

Highlights

  • Add In situ nanomechanical testing testing capabilities to your Xradia Ultra nanoscale 3D X-ray microscope (XRM)
  • Acquire 3D tomograms of your sample under load with resolution down to 50 nm
  • Perform a variety of nanomechanical tests such as compression, tension, and indentation
  • Study a wide range of materials including metals, ceramics, composites, polymers and biomaterials
  • Complement your mechanical test results from electron microscopy, microCT and stand-alone test set-ups to understand behavior across multiple length scales: from the atomic level and the nanoscale to the micro and macro scale.
  • Available in two models with different force measurement:
    LS108: 0.8 N maximum force
    LS190: 9 N maximum force

How it works
ZEISS Ultra Load Stage can be easily configured by the user. It comprises a piezomechanical actuator with closed loop position control, a strain gauge force sensor and sets of top and bottom anvils that enable the various modes. The sample is mounted between two anvils and a sensor measures the force on the sample as a function of anvil displacement.

modes

Compression

Observe deformation and failure of materials under uniaxial compressive load. Study elastic and plastic deformation and determine if the effects are uniform, anisotropic or localized relative to nanostructural features such as voids, struts or interfaces.

Tension

Observe deformation and failure of materials under uniaxial tensile load. Understand critical properties like elastic modulus and tensile yield strength and how they relate to the specific nanostructural features of the specimen.

Indentation

Study isolated deformation and failure events surrounding the indentation site. Understand crack generation and propagation, or delamination of coatings and layered structures.

Key applications
In situ nanomechanical testing is relevant for a broad range of
applications covering both engineered and natural materials.
Examples include:

  • High strength alloys
  • Biomaterials / biomechanics
  • Coatings
  • Building materials
  • Fibers / composites
  • Foams


Osteocyte lacunae
Osteocyte lacunae

SOFC
SOFC

Chalky carbonate
Chalky carbonate

Through Silicon Vias
Through Silicon Vias