ZEISS Xradia 520 Versa

ZEISS Xradia 520 Versa

Submicron Imaging with New Degrees of Freedom


Introduction



Extend the Limits of Exploration

ZEISS Xradia 520 Versa 3D X-ray microscope unlocks new degrees of flexibility for scientific discovery. Building on industry-best resolution and contrast, Xradia 520 Versa expands the boundaries of non-destructive imaging for breakthrough flexibility and discernment critical to your research. Innovative contrast and acquisition techniques free you to seek—and find—what you’ve never seen before to move beyond exploration and achieve discovery.

Contact us to learn more about applications for high resolution nondestructive imaging for your 4D and in situ studies
 


Highlights


The most comprehensive submicron X-ray imaging solution offering unprecedented flexibility

In addition to well known advantages offered by the ZEISS Xradia Versa series of X-ray microscopes–highest resolution, best contrast, RaaD (resolution at a distance) and non-destructive submicron X-ray imaging–ZEISS Xradia 520 Versa advances lab-based X-ray imaging with breakthrough techniques and innovations:

Optional Diffraction Contrast Tomography (LabDCT)
DSCoVer provides flexible side-by-side tuning of two distinct tomographies at different imaging conditions or sample conditions. This enables compositional probing for features normally indistinguishable in a single scan, enabling you to seamlessly and easily collect the data required for dual energy analysis. Imaging a sample at two different X-ray spectra, or in two different states, aligning the resulting datasets and then combining them assures you will achieve optimum contrast for the material of interest and allow you to establish repeatable research parameters.

Dual Scan Contrast Visualizer (DSCoVer)
DSCoVer provides flexible side-by-side tuning of two distinct tomographies at different imaging conditions or sample conditions. This enables compositional probing for features normally indistinguishable in a single scan, enabling you to seamlessly and easily collect the data required for dual energy analysis. Imaging a sample at two different X-ray spectra, or in two different states, aligning the resulting datasets and then combining them assures you will achieve optimum contrast for the material of interest and allow you to establish repeatable research parameters.

DSCoVer takes advantage of how X-rays interact with matter based on effective atomic number and density. This provides you with a unique capability for distinguishing, for example, mineralogical differences within rocks as well as among difficult-to-discern materials such as silicon and aluminum.

High-Aspect Ratio Tomography (HART)
The innovative High Aspect Ratio Tomography (HART) mode on Xradia 520 Versa provides you with higher throughput imaging for flat samples such as those found with semiconductor packages and boards. HART enables you to space variable projections so that you collect fewer projections along the broad side of a flat sample and more along the thin side. A wealth of 3D data is provided by these closely-spaced long views versus less densely-spaced short views.

You can also tune HART to emphasize higher throughput or better image quality, thereby potentially accelerating image acquisition speed by 2X.

Automated Filter Changer (AFC)
Now it’s even easier to image challenging samples. Source filters used to tune the X-ray energy spectrum are an important complement to DSCoVer and in situ applications. The AFC houses a standard range of 12 filters along with space for a dozen additional custom filters for new applications. Filter selection is easily programmed and recorded within imaging recipes so filters may be changed without disrupting the work flow.

Wide Field Mode
Wide Field Mode provides you with either an extended lateral field of view for imaging large sample types or higher resolution using the standard field of view, both in a single tomography. For larger samples, the lateral field of view is approximately twice as wide as the standard mode providing 3D volume more than three times larger. Using standard field of view, WFM provides nearly twice the number of voxels. Combining WFM with the existing Vertical Stitching feature enables you to image large samples that are both wider and taller than the standard field of view.

Optional Autoloader
Maximize your instrument’s utilization by minimizing user intervention with the optional Autoloader, available for all instruments in the ZEISS Xradia Versa series of 3D X-ray microscopes. Reduce the frequency of user interaction and increase productivity by enabling multiple jobs to run. Load up to 14 samples, queue, and allow to run all day, or off-shift. The software provides you with the flexibility to re-order, cancel and stop the queue to insert a high priority sample at any time. An e-mail notification feature in the Scout-and-Scan user interface provides timely updates on queue progress. Autoloader also enables a workflow solution for high volume repetitive scanning of like samples.

Optional In situ Interface Kit
X-ray imaging is uniquely suited to image materials under variable environments with controlled conditions including over time (4D) to non-destructively characterize and quantify the evolution of 3D microstructures. With its unique architecture, the Xradia Versa has emerged as the industry’s premier solution supporting the use of the widest variety of in situ rigs, from high pressure flow cells to tension, compression and thermal stages. The optional In Situ Interface Kit delivers stable and robust management of often complex in situ electrical and plumbing facilities and ensures Xradia performance is maintained, along with recipe-based software capability that simplifies operation from within the Xradia Versa user interface. The In Situ Interface Kit is available on all Xradia Versa systems.

Ask your ZEISS contact about ZEISS Xradia 520 Versa now!


Applications



Materials Research
Characterize materials, observe fracture mechanics, investigate properties at multiple length scales, quantify and characterize microstructural evolution. Perform in situ and 4D (time dependent studies) to understand the impact of heating, cooling, oxidation, wetting, tension, tensile compression, imbibition, drainage and other simulated environmental studies. Xradia 520 Versa offers non-destructive views into deeply buried micro-structures that may be unobservable with 2D surface imaging such as optical microscopy, SEM, and AFM; compositional contrast for studying low Z or “near Z” elements and other difficult-to-discern materials.

Natural Resources
Characterize and quantify pore structures, measure fluid flow, study carbon sequestration processes, analyze tailings to maximize mining efforts. Xradia 520 Versa offers the most accurate 3D submicron support for digital rock simulations, in situ multiphase fluid flow studies, and 3D mineralogy.

Life Sciences
Perform virtual histologies, visualize cellular and subcellular features, characterize submicron structures in samples that are inches to centimeters in size. Expand your views in developmental biology with high resolution, high contrast images of cellular and subcellular structures. Xradia 520 Versa offers the highest resolution and best contrast in of lab-based computed tomography solutions for unstained and stained hard and soft tissues and biological microstructure.

Electronics
Optimize your processes, determine package reliability, perform failure analysis, analyze package construction. Xradia 520 Versa offers Non-destructive submicron imaging of intact packages for defect re-localization and characterization with a fast time to results. Xradia Versa offer the industry’s highest resolution, non-destructive solution for 3D submicron imaging that complements or replaces physical cross sectioning methods.

To learn more about applications for ZEISS Xradia 520 Versa, click here.

LabDCT


Introducing ZEISS LabDCT
Unlock Crystallographic Information in Your Lab

Achieve direct visualization of 3D crystallographic grain orientation in a non-destructive tomography environment with the LabDCT™ advanced imaging module. Diffraction contrast tomography (DCT), previously available only at a limited number of synchrotron X-ray facilities, can become your routine tool for non-destructive 3D grain mapping with the introduction of LabDCT as an option for your ZEISS Xradia 520 Versa 3D X-ray microscope (XRM).

 

Acquire and reconstruct crystallographic information from polycrystalline samples such as metals and alloys with LabDCT, a combined hardware and software solution. Combining grain orientation information with microstructural features observed in absorption or phase contrast tomography (e.g. cracks, porosity, inclusions) helps to achieve new possibilities for characterizing damage, deformation and growth mechanisms related to 3D materials science. Accomplish an enhanced understanding of the fundamental materials science behind these processes with powerful microscopic imaging features in three dimensions.

New advantages for in situ and 4D science
Expose your samples to in situ environments within the microscope, or to an extended time evolution “4D” experiment (across days, weeks, months), a unique strength of laboratory-based XRM experiments over the synchrotron environment. For the first time, with LabDCT you can extend the ability of 4D and in situ microstructural evolution experiments to explore the influence of crystallography and understand mechanisms like corrosion on materials microstructures in a laboratory tomography instrument.

Correlative microscopy
Following an evolution experiment, your sample may be sent to the electron microscope or focused ion beam (FIB-SEM) for complementary high-resolution post-mortem investigation (such as EDS or EBSD) of identified volumes of interest. Such correlative workflows, efficiently enabled by ZEISS Atlas 5, point to the future of modern microscopy and seamlessly leverage the multi-modal, multi-scale and multi-dimensional characterization platforms provided by ZEISS.


Schematic of the LabDCT setup. The sample is illuminated through an aperture in front of the X-ray source. Both the sample absorption and diffraction information are recorded with a high resolution detection system

 

To learn more about applications for ZEISS Xradia 520 Versa, click here.

Software


Visualization and Analysis Software
ZEISS recommends Visual SI Advanced from Object Research Systems (ORS)
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray microscopy, FIB-SEM and SEM.
Using advanced visualization techniques and state-of-the-art volume rendering, Visual SI Advanced enables high definition exploration into the details and properties of 3D datasets.

Downloads





Introduction


Extend the Limits of Exploration

ZEISS Xradia 520 Versa 3D X-ray microscope unlocks new degrees of flexibility for scientific discovery. Building on industry-best resolution and contrast, Xradia 520 Versa expands the boundaries of non-destructive imaging for breakthrough flexibility and discernment critical to your research. Innovative contrast and acquisition techniques free you to seek—and find—what you’ve never seen before to move beyond exploration and achieve discovery.

Ask your ZEISS contact about ZEISS Xradia 520 Versa now!


Highlights


The most comprehensive submicron X-ray imaging solution offering unprecedented flexibility

In addition to well known advantages offered by the ZEISS Xradia Versa series of X-ray microscopes–highest resolution, best contrast, RaaD (resolution at a distance) and non-destructive submicron X-ray imaging–ZEISS Xradia 520 Versa advances lab-based X-ray imaging with breakthrough techniques and innovations:

Optional Diffraction Contrast Tomography (LabDCT)
DSCoVer provides flexible side-by-side tuning of two distinct tomographies at different imaging conditions or sample conditions. This enables compositional probing for features normally indistinguishable in a single scan, enabling you to seamlessly and easily collect the data required for dual energy analysis. Imaging a sample at two different X-ray spectra, or in two different states, aligning the resulting datasets and then combining them assures you will achieve optimum contrast for the material of interest and allow you to establish repeatable research parameters.

Dual Scan Contrast Visualizer (DSCoVer)
DSCoVer provides flexible side-by-side tuning of two distinct tomographies at different imaging conditions or sample conditions. This enables compositional probing for features normally indistinguishable in a single scan, enabling you to seamlessly and easily collect the data required for dual energy analysis. Imaging a sample at two different X-ray spectra, or in two different states, aligning the resulting datasets and then combining them assures you will achieve optimum contrast for the material of interest and allow you to establish repeatable research parameters.

DSCoVer takes advantage of how X-rays interact with matter based on effective atomic number and density. This provides you with a unique capability for distinguishing, for example, mineralogical differences within rocks as well as among difficult-to-discern materials such as silicon and aluminum.

High-Aspect Ratio Tomography (HART)
The innovative High Aspect Ratio Tomography (HART) mode on Xradia 520 Versa provides you with higher throughput imaging for flat samples such as those found with semiconductor packages and boards. HART enables you to space variable projections so that you collect fewer projections along the broad side of a flat sample and more along the thin side. A wealth of 3D data is provided by these closely-spaced long views versus less densely-spaced short views.

You can also tune HART to emphasize higher throughput or better image quality, thereby potentially accelerating image acquisition speed by 2X.

Automated Filter Changer (AFC)
Now it’s even easier to image challenging samples. Source filters used to tune the X-ray energy spectrum are an important complement to DSCoVer and in situ applications. The AFC houses a standard range of 12 filters along with space for a dozen additional custom filters for new applications. Filter selection is easily programmed and recorded within imaging recipes so filters may be changed without disrupting the work flow.

Wide Field Mode
Wide Field Mode provides you with either an extended lateral field of view for imaging large sample types or higher resolution using the standard field of view, both in a single tomography. For larger samples, the lateral field of view is approximately twice as wide as the standard mode providing 3D volume more than three times larger. Using standard field of view, WFM provides nearly twice the number of voxels. Combining WFM with the existing Vertical Stitching feature enables you to image large samples that are both wider and taller than the standard field of view.

Optional Autoloader
Maximize your instrument’s utilization by minimizing user intervention with the optional Autoloader, available for all instruments in the ZEISS Xradia Versa series of 3D X-ray microscopes. Reduce the frequency of user interaction and increase productivity by enabling multiple jobs to run. Load up to 14 samples, queue, and allow to run all day, or off-shift. The software provides you with the flexibility to re-order, cancel and stop the queue to insert a high priority sample at any time. An e-mail notification feature in the Scout-and-Scan user interface provides timely updates on queue progress. Autoloader also enables a workflow solution for high volume repetitive scanning of like samples.

Optional In situ Interface Kit
X-ray imaging is uniquely suited to image materials under variable environments with controlled conditions including over time (4D) to non-destructively characterize and quantify the evolution of 3D microstructures. With its unique architecture, the Xradia Versa has emerged as the industry’s premier solution supporting the use of the widest variety of in situ rigs, from high pressure flow cells to tension, compression and thermal stages. The optional In Situ Interface Kit delivers stable and robust management of often complex in situ electrical and plumbing facilities and ensures Xradia performance is maintained, along with recipe-based software capability that simplifies operation from within the Xradia Versa user interface. The In Situ Interface Kit is available on all Xradia Versa systems.

Ask your ZEISS contact about ZEISS Xradia 520 Versa now!


Applications


Materials Research
Characterize materials, observe fracture mechanics, investigate properties at multiple length scales, quantify and characterize microstructural evolution. Perform in situ and 4D (time dependent studies) to understand the impact of heating, cooling, oxidation, wetting, tension, tensile compression, imbibition, drainage and other simulated environmental studies. Xradia 520 Versa offers non-destructive views into deeply buried micro-structures that may be unobservable with 2D surface imaging such as optical microscopy, SEM, and AFM; compositional contrast for studying low Z or “near Z” elements and other difficult-to-discern materials.

Natural Resources
ZEISS delivers unparalleled imaging quality for soft materials such as stained or unstained tissue and hard materials such as bone or dentin. Advantages include high resolution, high absorption contrast, and unique phase contrast technology for developmental biology, biomechanics, neuroscience, 3D cellular composition. Non-destructive X-ray technology facilitates correlative microscopy, augmenting fluorescence results and gaining powerful insight before the sample must be sacrificed in the EM lab.

Life Sciences
Perform virtual histologies, visualize cellular and subcellular features, characterize submicron structures in samples that are inches to centimeters in size. Expand your views in developmental biology with high resolution, high contrast images of cellular and subcellular structures. Xradia 520 Versa offers the highest resolution and best contrast in of lab-based computed tomography solutions for unstained and stained hard and soft tissues and biological microstructure.

Electronics
Optimize your processes, determine package reliability, perform failure analysis, analyze package construction. Xradia 520 Versa offers Non-destructive submicron imaging of intact packages for defect re-localization and characterization with a fast time to results. Xradia Versa offer the industry’s highest resolution, non-destructive solution for 3D submicron imaging that complements or replaces physical cross sectioning methods.

To learn more about applications for ZEISS Xradia 520 Versa, click here.

LabDCT


Introducing ZEISS LabDCT
Unlock Crystallographic Information in Your Lab

Achieve direct visualization of 3D crystallographic grain orientation in a non-destructive tomography environment with the LabDCT™ advanced imaging module. Diffraction contrast tomography (DCT), previously available only at a limited number of synchrotron X-ray facilities, can become your routine tool for non-destructive 3D grain mapping with the introduction of LabDCT as an option for your ZEISS Xradia 520 Versa 3D X-ray microscope (XRM).

 

Acquire and reconstruct crystallographic information from polycrystalline samples such as metals and alloys with LabDCT, a combined hardware and software solution. Combining grain orientation information with microstructural features observed in absorption or phase contrast tomography (e.g. cracks, porosity, inclusions) helps to achieve new possibilities for characterizing damage, deformation and growth mechanisms related to 3D materials science. Accomplish an enhanced understanding of the fundamental materials science behind these processes with powerful microscopic imaging features in three dimensions.

New advantages for in situ and 4D science
Expose your samples to in situ environments within the microscope, or to an extended time evolution “4D” experiment (across days, weeks, months), a unique strength of laboratory-based XRM experiments over the synchrotron environment. For the first time, with LabDCT you can extend the ability of 4D and in situ microstructural evolution experiments to explore the influence of crystallography and understand mechanisms like corrosion on materials microstructures in a laboratory tomography instrument.

Correlative microscopy
Following an evolution experiment, your sample may be sent to the electron microscope or focused ion beam (FIB-SEM) for complementary high-resolution post-mortem investigation (such as EDS or EBSD) of identified volumes of interest. Such correlative workflows, efficiently enabled by ZEISS Atlas 5, point to the future of modern microscopy and seamlessly leverage the multi-modal, multi-scale and multi-dimensional characterization platforms provided by ZEISS.


Schematic of the LabDCT setup. The sample is illuminated through an aperture in front of the X-ray source. Both the sample absorption and diffraction information are recorded with a high resolution detection system

 

Software


Visualization and Analysis Software
ZEISS recommends Visual SI Advanced from Object Research Systems (ORS)
An advanced analysis and visualization software solution for your 3D data acquired by a variety of technologies including X-ray microscopy, FIB-SEM and SEM.
Using advanced visualization techniques and state-of-the-art volume rendering, Visual SI Advanced enables high definition exploration into the details and properties of 3D datasets.

Benefits


The unique Xradia 520 Versa architecture delivers unsurpassed flexibility
  • Unprecedented resolution in non-destructive 3D X-ray imaging
  • True spatial resolution <700 nm
  • Below 70 nm minimum achievable voxel
  • Two-stage magnification that provides Resolution at a Distance (RaaD), delivering large, flexible working distances while maintaining submicron resolution
  • Non-destructive interior tomography uniquely enabled by Scout-and-Zoom
Advanced contrast capabilities for imaging challenging samples
  • Enhanced absorption contrast detectors maximize collection of contrast-forming low energy X-ray photons that are critical to imaging numerous material types
  • Tunable propagation phase contrast to visualize low Z materials and biological samples that tend to have limited absorption contrast
  • Maximum discernibility with dual energy probing of features normally indistinguishable within a single scan
The premier in situ and 4D solution
  • Nondestructive X-ray microscopes uniquely characterize the microstructure of materials in simulated conditions—in situ—as well as the evolution of properties over time (4D)
  • Supporting a wide variety of in situ rigs for submicron imaging of samples up to inches in size within environmental chambers and under varying conditions
  • RaaD enables Xradia Versa to maintain high resolution as the space between the X-ray source and sample grows whereas the resolution of conventional micro-CT architecture degrades when samples are placed within spacious in situ chambers
  • Wide Field Mode (WFM) nearly 2X as wide as the standard mode for larger field of view at resolution. Resulting 3D volumes are more than 3X larger
  • Super simple control system for efficient workflows, ideal for a central lab-type setting where your users may have a wide variety of experience levels
System stability
  • vibrational isolation, thermal stabilization, low noise detector
  • Powerful dual GPU workstation that accelerates image reconstruction time by up to 40%
  • Optional Versa In Situ Kit organizes the facilities that support environmental chambers (such as wiring and plumbing) to enable maximum imaging performance and ease set-up
  • Autoloader option enables you to program and run up to 14 samples at a time to maximize productivity, automate workflows for high volume scanning


Downloads



Brain Tissue
Brain Tissue

Polymer Composite
Polymer Composite

Cuttlefish

Broken TSV
Broken TSV

Visualization & Analysis Software
| Visual SI Advanced